Crystallographic defect

Crystalline solids have a very regular atomic structure: that is, the local positions of atoms with respect to each other are repeated at the atomic scale. These arrangements are called crystal structures, and their study is called crystallography. However, most crystalline materials are not perfect: the regular pattern of atomic arrangement is interrupted by crystal defects. The various types of defects are enumerated here.

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Point defects

Line defects

Edge dislocations are caused by the termination of a plane of atoms in the middle of a crystal. In such a case, the adjacent planes are not straight, but instead bend around the edge of the terminating plane so that the crystal structure is perfectly ordered on either side. The analogy with a stack of paper is apt: if a half a piece of paper is inserted in a stack of paper, the defect in the stack is only noticeable at the edge of the half sheet.

The screw dislocation is more difficult to visualise, but basically comprises a structure in which a helical path is traced around the linear defect (dislocation line) by the atomic planes of atoms in the crystal lattice.

The presence of dislocations results in lattice strain (distortion). The direction and magnitude of such distortion is expressed in terms of a BURGERS VECTOR (b). For an edge type, b is perpendicular to the dislocation line, whereas in the cases of the screw type it is parallel. In metallic materials, b is alligned with close-packed crytallographic directions and its magnitude is equivalent to one interatomic spacing.

Dislocations can move if the atoms from one of the surrounding planes break their bonds and rebond with the atoms at the terminating edge.

It is the presence of dislocations and their ability to readily move (and interact) under the influence of stresses induced by external loads that leads to the characteristic malleability of metallic materials.

Dislocations can be observed using transmission electron microscopy, field ion microscopy and atom probe techniques.

Planar defects

Bulk defects

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See also: Crystallographic defect, Atom probe, Crystal, Crystallography, Dislocation, Field ion microscopy, Hagen Kleinert, Hydrogen, Interstitial, Malleability